Recent technological breakthroughs in synchrotron and x-ray free electron laser facilities have revolutionized nanoscale structural and dynamic analyses in condensed matter systems. This review provides a comprehensive overview of the advancements in coherent scattering and diffractive imaging techniques, which are now at the forefront of exploring materials science complexities. These techniques, notably Bragg coherent diffractive imaging and x-ray photon correlation spectroscopy, x-ray magnetic dichroism, and x-ray correlation analysis leverage beam coherence to achieve volumetric three-dimensional imaging at unprecedented sub-nanometer resolutions and explore dynamic phenomena within sub-millisecond timeframes. Such capabilities are critical in understanding and developing advanced materials and technologies. Simultaneously, the emergence of chiral crystals—characterized by their unique absence of standard inversion, mirror, or other roto-inversion symmetries—presents both challenges and opportunities. These materials exhibit distinctive interactions with light, leading to phenomena such as molecular optical activity, chiral photonic waveguides, and valley-specific light emissions, which are pivotal in the burgeoning fields of photonic and spintronic devices. This review elucidates how novel x-ray probes can be leveraged to unravel these properties and their implications for future technological applications. A significant focus of this review is the exploration of new avenues in research, particularly the shift from conventional methods to more innovative approaches in studying these chiral materials. Inspired by structured optical beams, the potential of coherent scattering techniques utilizing twisted x-ray beams is examined. This promising direction not only offers higher spatial resolution but also opens the door to previously unattainable insights in materials science. By contextualizing these advancements within the broader scientific landscape and highlighting their practical applications, this review aims to chart a course for future research in this rapidly evolving field.

中文翻译：

---

扭曲 X 射线相干衍射成像：原理、应用和前景

同步加速器和 X 射线自由电子激光设施的最新技术突破彻底改变了凝聚态物质系统中的纳米级结构和动态分析。这篇综述全面概述了相干散射和衍射成像技术的进展，这些技术目前处于探索材料科学复杂性的前沿。这些技术，特别是布拉格相干衍射成像和 X 射线光子相关光谱、X 射线磁二色性和 X 射线相关分析，利用光束相干性以前所未有的亚纳米分辨率实现体积三维成像，并探索亚纳米范围内的动态现象。 - 毫秒时间范围。这些能力对于理解和开发先进材料和技术至关重要。与此同时，手性晶体的出现（其特点是其独特的缺乏标准反转、镜像或其他旋转反转对称性）既带来了挑战，也带来了机遇。这些材料表现出与光独特的相互作用，导致分子光学活性、手性光子波导和谷特定光发射等现象，这些现象在光子和自旋电子器件的新兴领域中至关重要。这篇综述阐明了如何利用新型 X 射线探针来揭示这些特性及其对未来技术应用的影响。本综述的一个重要重点是探索新的研究途径，特别是在研究这些手性材料时从传统方法转向更具创新性的方法。受结构化光束的启发，利用扭曲 X 射线束的相干散射技术的潜力得到了检验。这个有前途的方向不仅提供了更高的空间分辨率，而且为材料科学中以前无法实现的见解打开了大门。通过将这些进步置于更广泛的科学领域中并强调其实际应用，本综述旨在为这个快速发展的领域的未来研究制定路线。