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Investigation on Formation and Evolution Behavior of Short-circuit Path in Press-pack IGBT Modules
IEEE Journal of Emerging and Selected Topics in Power Electronics ( IF 5.5 ) Pub Date : 2024-04-09 , DOI: 10.1109/jestpe.2024.3385100 Renkuan Liu 1 , Hui Li 2 , Ran Yao 2 , Wei Lai 2 , Siyu Chen 2 , Xianping Chen 2 , Zhongyuan Chen 3
中文翻译：
紧压封装 IGBT 模块短路路径形成及演化行为研究
更新日期：2024-04-09
IEEE Journal of Emerging and Selected Topics in Power Electronics ( IF 5.5 ) Pub Date : 2024-04-09 , DOI: 10.1109/jestpe.2024.3385100 Renkuan Liu 1 , Hui Li 2 , Ran Yao 2 , Wei Lai 2 , Siyu Chen 2 , Xianping Chen 2 , Zhongyuan Chen 3
Affiliation
中文翻译：
紧压封装 IGBT 模块短路路径形成及演化行为研究
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