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Radiochromic semiconductive MOFs with high sensitivity and fast photochromic responses for dual-mode X-ray direct detection
Inorganic Chemistry Frontiers ( IF 7 ) Pub Date : 2024-04-17 , DOI: 10.1039/d4qi00771a
Xu-Ying Yu 1, 2 , Jia-Rong Mi 1 , Qiu-Pei Qin 1, 3 , Xin-Ping Fang 1, 3 , Yong-Fang Han 4 , Li-Zhen Cai 1 , Ming-Sheng Wang 1 , Guo-Cong Guo 1
Affiliation  

X-ray direct detectors, which may directly convert X-rays into electrical signals through semiconductors, are highly desirable for early cancer screening and other applications. Prevailing commercial amorphous Se detectors still suffer from low phase instability and low sensitivity, while the emerging perovskite detectors are subjected to low chemical instability despite high sensitivity and low detection limits. This work reports a viologen-templated Dy(III)-based metal–organic framework (MOF) with radiochromic semiconductive properties and high framework thermal (up to approximately 280 °C) and radiation stability. Its single-crystal detector has an exceptional sensitivity (6385 μC Gy−1 cm−2 at 271 V cm−1) to tungsten anode X-rays compared to amorphous Se (20 μC Gy−1 cm−2 at −10 000 V cm−1), single-crystal MAPbI3 perovskite (968.9 μC Gy−1 cm−2 at −10 V cm−1), and other single-crystal or pellet MOF-based direct detectors (20–3500 μC Gy−1 cm−2). Moreover, it exhibits a rapid photochromic response within 10 seconds upon X-ray irradiation and can naturally fade for easy reuse. This property offers the convenience of quickly capturing object information through visual inspection and serves as an alternative means of direct detection outside of traditional electrical imaging methods.

中文翻译:

具有高灵敏度和快速光致变色响应的放射致变色半导体 MOF,用于双模 X 射线直接检测

X射线直接探测器可以通过半导体直接将X射线转换成电信号,对于早期癌症筛查和其他应用来说是非常理想的。流行的商用非晶硒探测器仍然存在低相位不稳定性和低灵敏度的问题,而新兴的钙钛矿探测器尽管具有高灵敏度和低检测限,但仍存在低化学不稳定性。这项工作报道了一种紫精模板化的 Dy( III ) 基金属有机框架 (MOF),具有放射致变色半导体特性和高框架热稳定性(高达约 280 °C)和辐射稳定性。与非晶硒(-10 000 V cm -1 时 20 μC Gy -1 cm -2 )相比,其单晶探测器对钨阳极 X 射线具有卓越的灵敏度(271 V cm -1时为 6385 μC Gy -1 cm -2 ) -1)、单晶 MAPbI 3钙钛矿(968.9 μC Gy -1 cm -2 at -10 V cm -1)和其他单晶或基于 MOF 颗粒的直接探测器(20–3500 μC Gy -1 cm - 2)。此外,它在 X 射线照射下 10 秒内表现出快速光致变色响应,并且可以自然褪色,以便于重复使用。这一特性提供了通过视觉检查快速捕获物体信息的便利,并可作为传统电子成像方法之外的直接检测的替代手段。
更新日期:2024-04-17
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