当前位置: X-MOL 学术Adv. Theory Simul. › 论文详情
Our official English website, www.x-mol.net, welcomes your feedback! (Note: you will need to create a separate account there.)
Point Defects in Hexagonal SiP Monolayer: A Systematic Investigation on the Electronic and Magnetic Properties
Advanced Theory and Simulations ( IF 3.3 ) Pub Date : 2024-05-05 , DOI: 10.1002/adts.202400320
Chu Viet Ha 1 , R Ponce‐Pérez 2 , J. Guerrero‐Sanchez 2 , D. M. Hoat 3, 4
Affiliation  

In this work, point defects are proposed to modify the electronic and magnetic properties of SiP monolayer. Pristine monolayer is a non-magnetic semiconductor 2D material with energy gap of 1.52(2.21) eV as predicted by PBE(HSE06) functional. Single Si vacancy (VSi${\rm V}_{Si}$), Si+P divacancy (VSiP${\rm V}_{SiP}$), and substituting one P atom by one Si atom (SiP${\rm Si}_{P}$) magnetize significantly SiP monolayer. Herein, total magnetic moments between 1.00 and 2.00 μB$\mu _{B}$ are obtained VSi${\rm V}_{Si}$ VSiP${\rm V}_{SiP}$ SiP${\rm Si}_{P}$. In contrast, no magnetism is induced by single P vacancy (VP${\rm V}_{P}$), substituting one Si atom by one P atom (PSi${\rm P}_{Si}$), and exchanging pair Si-P positions (SiP${\rm Si}\leftrightarrow {\rm P}$). Moreover, significant magnetization of SiP monolayer is also achieved by doping with single Li and Cu atoms (LiSi${\rm Li}_{Si}$ and CuSi${\rm Cu}_{Si}$), as well as pair of Li and Cu atoms (pLiSi${\rm pLi}_{Si}$ and pCuSi${\rm pCu}_{Si}$). Total magnetic moments between 0.84 and 1.42 μB$\mu _{B}$ are obtained. Interestingly, the half-metallicity is observed in LiSi${\rm Li}_{Si}$ and CuSi${\rm Cu}_{Si}$ systems. When substituting P atom, F, Cl, and Br impurities reduce significantly the SiP monolayer bandgap, preserving its non-magnetic nature. In contrast, a total magnetic moment of 1.26 μB$\mu _{B}$ is obtained by doping with I atom. Results presented herein may introduce the defected and doped SiP systems as prospective 2D candidates for spintronic and optoelectronic applications.

中文翻译:


六角形 SiP 单层中的点缺陷:电子和磁性特性的系统研究



在这项工作中,提出了点缺陷来改变 SiP 单层的电子和磁性特性。原始单层是一种非磁性半导体二维材料,根据 PBE(HSE06) 泛函预测,其能隙为 1.52(2.21) eV。单Si空位( VSi${\rm V}_{Si}$ )、Si+P双空位( VSiP${\rm V}_{SiP}$ )和一个P原子被一个Si原子取代( SiP${\rm Si}_{P}$ )显着磁化SiP单层。这里,获得1.00和2.00之间的总磁矩 μB$\mu _{B}$ VSi${\rm V}_{Si}$ VSiP${\rm V}_{SiP}$ SiP${\rm Si}_{P}$ 。相反,单个 P 空位 ( VP${\rm V}_{P}$ )、用一个 P 原子取代一个 Si 原子 ( PSi${\rm P}_{Si}$ ) 以及交换对 Si-P 位置 ( SiP${\rm Si}\leftrightarrow {\rm P}$ )。此外,SiP单层的显着磁化还可以通过掺杂单个Li和Cu原子( LiSi${\rm Li}_{Si}$CuSi${\rm Cu}_{Si}$ )以及一对Li和Cu原子( pLiSi${\rm pLi}_{Si}$ )。获得的总磁矩在 0.84 和 1.42 μB$\mu _{B}$ 之间。有趣的是,在 LiSi${\rm Li}_{Si}$CuSi${\rm Cu}_{Si}$ 系统中观察到半金属性。当取代 P 原子时,F、Cl 和 Br 杂质显着降低了 SiP 单层带隙,保留了其非磁性性质。相比之下,通过掺杂I原子获得了1.26 μB$\mu _{B}$ 的总磁矩。本文提出的结果可能会引入缺陷和掺杂的 SiP 系统作为自旋电子和光电应用的潜在 2D 候选系统。
更新日期:2024-05-05
down
wechat
bug