The identification of nanoparticles within heterogeneous mixtures poses significant challenges due to the similarity in physical properties among different nanomaterials. Here, we present electrochemically assisted high-resolution plasmonic scattering interferometric microscopy (HR-PSIM). This technique allows for the high-throughput identification of nanoparticles by accurately measuring the refractive index of individual nanoparticles without interference from background signals. Through elimination of parabolic scattering interference and employing electrochemical modulation, HR-PSIM demonstrates high spatial resolution and stability against background noise, enabling the differentiation of nanoparticles with closely matched refractive indices, such as Au and Ag nanoparticles. The efficacy of this method is demonstrated through its application in real-time, label-free imaging of nanoparticle electrochemical activity, providing a platform for the precise and high-throughput characterization of nanomaterials. The robustness of our approach against electrochemical interference and its high spatial resolution mark a significant advancement in the field of nanomaterial analysis, promising wide-ranging applications in nanoparticle research and beyond.

中文翻译：

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通过电化学辅助高分辨率等离激元散射干涉显微镜对单个纳米粒子进行高通量鉴定


由于不同纳米材料之间物理性质的相似性，异质混合物中纳米颗粒的识别提出了重大挑战。在这里，我们提出了电化学辅助高分辨率等离子体散射干涉显微镜（HR-PSIM）。该技术可以通过精确测量单个纳米粒子的折射率来高通量识别纳米粒子，而不受背景信号的干扰。通过消除抛物线散射干扰并采用电化学调制，HR-PSIM 表现出高空间分辨率和对背景噪声的稳定性，从而能够区分折射率紧密匹配的纳米颗粒，例如金和银纳米颗粒。该方法的有效性通过其在纳米颗粒电化学活性的实时、无标记成像中的应用得到了证明，为纳米材料的精确和高通量表征提供了一个平台。我们的方法对抗电化学干扰的稳健性及其高空间分辨率标志着纳米材料分析领域的重大进步，有望在纳米颗粒研究及其他领域得到广泛应用。